[1]Koumura,Nagatoshi;Geertsema,EdzardM.;VanGelder,MarcB.;Meetsma,Auke;Feringa,BenL.[JournaloftheAmericanChemicalSociety,2002,vol.124,#18,p.5037-5051]
[1]Koumura,Nagatoshi;Geertsema,EdzardM.;VanGelder,MarcB.;Meetsma,Auke;Feringa,BenL.[JournaloftheAmericanChemicalSociety,2002,vol.124,#18,p.5037-5051]
[1]Koumura,Nagatoshi;Geertsema,EdzardM.;VanGelder,MarcB.;Meetsma,Auke;Feringa,BenL.[JournaloftheAmericanChemicalSociety,2002,vol.124,#18,p.5037-5051]
[1]Koumura,Nagatoshi;Geertsema,EdzardM.;VanGelder,MarcB.;Meetsma,Auke;Feringa,BenL.[JournaloftheAmericanChemicalSociety,2002,vol.124,#18,p.5037-5051]
[1]Locationinpatent:experimentalpartUmemoto,Shiori;Im,Seongwang;Zhang,Jinhua;Hagihara,Masaki;Murata,Asako;Harada,Yasue;Fukuzumi,Takeo;Wazaki,Takahiro;Sasaoka,Shin-Ichi;Nakatani,Kazuhiko[Chemistry-AEuropeanJournal,2012,vol.18,#32,p.9999-10008]